Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry (Q542954): Difference between revisions
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Property / Mathematics Subject Classification ID: 62H35 / rank | |||
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Property / Mathematics Subject Classification ID: 92C55 / rank | |||
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Property / Mathematics Subject Classification ID: 65C60 / rank | |||
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Property / Mathematics Subject Classification ID: 62G05 / rank | |||
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Property / zbMATH DE Number: 5910053 / rank | |||
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image analysis | |||
Property / zbMATH Keywords: image analysis / rank | |||
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semiparametric estimation | |||
Property / zbMATH Keywords: semiparametric estimation / rank | |||
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reflection symmetry | |||
Property / zbMATH Keywords: reflection symmetry / rank | |||
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two-dimensional functions | |||
Property / zbMATH Keywords: two-dimensional functions / rank | |||
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Zernike polynomials | |||
Property / zbMATH Keywords: Zernike polynomials / rank | |||
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confocal microscopy | |||
Property / zbMATH Keywords: confocal microscopy / rank | |||
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Revision as of 11:42, 1 July 2023
scientific article
Language | Label | Description | Also known as |
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English | Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry |
scientific article |
Statements
Improving PSF calibration in confocal microscopic imaging -- estimating and exploiting bilateral symmetry (English)
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20 June 2011
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image analysis
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semiparametric estimation
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reflection symmetry
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two-dimensional functions
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Zernike polynomials
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confocal microscopy
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