Neural network metamodeling for cycle time-throughput profiles in manufacturing (Q2270307): Difference between revisions
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scientific article
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English | Neural network metamodeling for cycle time-throughput profiles in manufacturing |
scientific article |
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Neural network metamodeling for cycle time-throughput profiles in manufacturing (English)
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18 March 2010
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discrete event simulation
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response surface modeling
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design of experiments
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semiconductor manufacturing
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queueing
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