Creep flow, diffusion, and electromigration in small scale interconnects (Q1019389): Difference between revisions
From MaRDI portal
Set profile property. |
Set OpenAlex properties. |
||
| Property / full work available at URL | |||
| Property / full work available at URL: https://doi.org/10.1016/j.jmps.2006.06.001 / rank | |||
Normal rank | |||
| Property / OpenAlex ID | |||
| Property / OpenAlex ID: W2141063909 / rank | |||
Normal rank | |||
Revision as of 21:40, 19 March 2024
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Creep flow, diffusion, and electromigration in small scale interconnects |
scientific article |
Statements
Creep flow, diffusion, and electromigration in small scale interconnects (English)
0 references
2 June 2009
0 references
electromigration
0 references
creep
0 references
nanostructure
0 references
phase field model
0 references
