Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (Q5286311): Difference between revisions

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Latest revision as of 21:28, 19 March 2024

scientific article; zbMATH DE number 223863
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English
Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors
scientific article; zbMATH DE number 223863

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    Modeling and Analysis of Laser-Beam-Induced Current Images in Semiconductors (English)
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    29 June 1993
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    nondestructive optical testing technique
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    stationary basic semiconductor equations
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    wellposedness of the model equations
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    approximate model
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