Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in (Q5408760): Difference between revisions

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Latest revision as of 23:43, 19 March 2024

scientific article; zbMATH DE number 6283110
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English
Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in
scientific article; zbMATH DE number 6283110

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    Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in (English)
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    11 April 2014
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    identity testing
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    arithmetic circuits
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    derandomization
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    bounded depth circuits
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    multilinear circuits
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