An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem (Q2891244): Difference between revisions

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Revision as of 00:08, 20 March 2024

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An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem
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    An evaluation of the extrinsic cells number in a memory array using cross-correlation products and deconvolution: an instance of a microelectronics experimental inverse problem (English)
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    13 June 2012
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    non-volatile memories
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    EEPROM
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    flash memory
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    CAST
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    deconvolution
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    counting extrinsic cells
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    reliability
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