On the noise induced by the measurement of the THz electrical current in quantum devices (Q3302678): Difference between revisions

From MaRDI portal
Set OpenAlex properties.
Importer (talk | contribs)
Changed an Item
Property / arXiv ID
 
Property / arXiv ID: 1602.06575 / rank
 
Normal rank

Revision as of 15:05, 19 April 2024

scientific article
Language Label Description Also known as
English
On the noise induced by the measurement of the THz electrical current in quantum devices
scientific article

    Statements

    On the noise induced by the measurement of the THz electrical current in quantum devices (English)
    0 references
    0 references
    0 references
    0 references
    11 August 2020
    0 references

    Identifiers