Scheduling of wafer test processes in semiconductor manufacturing (Q4474714): Difference between revisions
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| Property / cites work: The Shifting Bottleneck Procedure for Job Shop Scheduling / rank | |||
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| Property / cites work: An interactive scheduler for a wafer probe centre in semiconductor manufacturing / rank | |||
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| Property / cites work: Rolling horizon procedures for dynamic parallel machine scheduling with sequence-dependent setup times / rank | |||
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| Property / cites work: The wafer probing scheduling problem (WPSP) / rank | |||
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| Property / cites work: Q3989986 / rank | |||
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Latest revision as of 18:28, 6 June 2024
scientific article; zbMATH DE number 2078834
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Scheduling of wafer test processes in semiconductor manufacturing |
scientific article; zbMATH DE number 2078834 |
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Scheduling of wafer test processes in semiconductor manufacturing (English)
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12 July 2004
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