Multi-layer thin films/substrate system subjected to non-uniform misfit strains (Q837355): Difference between revisions

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+Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. II: Experimental validation of the non-local stress/curvature relations
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+Substrate curvature due to thin film mismatch strain in the nonlinear deformation range
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+Thin Film Materials
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+Non-uniform, axisymmetric misfit strain in thin films bonded on plate substrates/substrate systems: the relation between non-uniform film stresses and system curvatures
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+Extension of Stoney's formula to non-uniform temperature distributions in thin film/substrate systems. The case of radial symmetry
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+Geometrically nonlinear stress-deflection relations for thin film/substrate systems
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+Thin film/substrate systems featuring arbitrary film thickness and misfit strain distributions. I: Analysis for obtaining film stress from non-local curvature information
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+Bifurcation in isotropic thin film/substrate plates
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+Thermoelastic analysis of periodic thin lines deposited on a substrate
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