Q5144821 (Q5144821): Difference between revisions

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+Experimental Design for a Class of Accelerated Degradation Tests
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+A Limited Memory Algorithm for Bound Constrained Optimization
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+Q5321472
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+Q5398748
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+Monte Carlo sampling methods using Markov chains and their applications
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+Q4079017
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+Optimal design of accelerated degradation tests based on Wiener process models
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+Equation of State Calculations by Fast Computing Machines
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+Bayesian Modeling Using WinBUGS
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+Inference from accelerated degradation and failure data based on Gaussian process models
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+Accelerated degradation models for failure based on geometric Brownian motion and gamma processes
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+A note on optimal allocations for the second elementary symmetric function with applications for optimal reliability design
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+Estimating degradation by a Wiener diffusion process subject to measurement error
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