Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (Q2032232): Difference between revisions

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Latest revision as of 00:57, 26 July 2024

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Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives
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    Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (English)
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    16 June 2021
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    quality control
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    acceptance sampling
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    process yield
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    average sample number
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    operating characteristic curve
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