Identifying defects in an unknown background using differential measurements (Q256039): Difference between revisions
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| Property / Mathematics Subject Classification ID | |||
| Property / Mathematics Subject Classification ID: 35R30 / rank | |||
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| Property / Mathematics Subject Classification ID: 35R60 / rank | |||
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| Property / Mathematics Subject Classification ID: 65M32 / rank | |||
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| Property / zbMATH DE Number | |||
| Property / zbMATH DE Number: 6552749 / rank | |||
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| Property / zbMATH Keywords | |||
inverse scattering problems | |||
| Property / zbMATH Keywords: inverse scattering problems / rank | |||
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linear sampling method | |||
| Property / zbMATH Keywords: linear sampling method / rank | |||
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factorization method | |||
| Property / zbMATH Keywords: factorization method / rank | |||
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qualitative methods | |||
| Property / zbMATH Keywords: qualitative methods / rank | |||
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differential measurements | |||
| Property / zbMATH Keywords: differential measurements / rank | |||
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Revision as of 13:21, 27 June 2023
scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Identifying defects in an unknown background using differential measurements |
scientific article |
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Identifying defects in an unknown background using differential measurements (English)
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9 March 2016
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inverse scattering problems
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linear sampling method
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factorization method
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qualitative methods
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differential measurements
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