Influence of the analysis window on the metrological performance of the grid method (Q333624): Difference between revisions
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Property / Mathematics Subject Classification ID: 94A08 / rank | |||
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Property / Mathematics Subject Classification ID: 62H25 / rank | |||
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Property / zbMATH DE Number: 6645625 / rank | |||
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image-based contactless measurement | |||
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displacement and strain maps | |||
Property / zbMATH Keywords: displacement and strain maps / rank | |||
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grid method | |||
Property / zbMATH Keywords: grid method / rank | |||
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windowed Fourier analysis | |||
Property / zbMATH Keywords: windowed Fourier analysis / rank | |||
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spatially correlated noise | |||
Property / zbMATH Keywords: spatially correlated noise / rank | |||
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derivative of a random process | |||
Property / zbMATH Keywords: derivative of a random process / rank | |||
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Wigner-ville transform | |||
Property / zbMATH Keywords: Wigner-ville transform / rank | |||
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Revision as of 04:39, 28 June 2023
scientific article
Language | Label | Description | Also known as |
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English | Influence of the analysis window on the metrological performance of the grid method |
scientific article |
Statements
Influence of the analysis window on the metrological performance of the grid method (English)
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31 October 2016
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image-based contactless measurement
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displacement and strain maps
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grid method
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windowed Fourier analysis
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spatially correlated noise
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derivative of a random process
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Wigner-ville transform
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