Influence of the analysis window on the metrological performance of the grid method (Q333624): Difference between revisions

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Property / Mathematics Subject Classification ID: 94A08 / rank
 
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Property / Mathematics Subject Classification ID: 62H25 / rank
 
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Property / zbMATH DE Number: 6645625 / rank
 
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image-based contactless measurement
Property / zbMATH Keywords: image-based contactless measurement / rank
 
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displacement and strain maps
Property / zbMATH Keywords: displacement and strain maps / rank
 
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grid method
Property / zbMATH Keywords: grid method / rank
 
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windowed Fourier analysis
Property / zbMATH Keywords: windowed Fourier analysis / rank
 
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spatially correlated noise
Property / zbMATH Keywords: spatially correlated noise / rank
 
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derivative of a random process
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Wigner-ville transform
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Revision as of 04:39, 28 June 2023

scientific article
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English
Influence of the analysis window on the metrological performance of the grid method
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    Influence of the analysis window on the metrological performance of the grid method (English)
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    31 October 2016
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    image-based contactless measurement
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    displacement and strain maps
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    grid method
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    windowed Fourier analysis
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    spatially correlated noise
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    derivative of a random process
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    Wigner-ville transform
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