Optimized allocation of defect inspection capacity with a dynamic sampling strategy (Q337310): Difference between revisions

@@ Property / Mathematics Subject Classification ID @@
+B25
@@ Property / Mathematics Subject Classification ID: 90B25 / rank @@
+Normal rank
@@ Property / Mathematics Subject Classification ID @@
+B90
@@ Property / Mathematics Subject Classification ID: 90B90 / rank @@
+Normal rank
@@ Property / Mathematics Subject Classification ID @@
+B30
@@ Property / Mathematics Subject Classification ID: 90B30 / rank @@
+Normal rank
@@ Property / Mathematics Subject Classification ID @@
+C05
@@ Property / Mathematics Subject Classification ID: 90C05 / rank @@
+Normal rank
@@ Property / zbMATH DE Number @@
+6650785
@@ Property / zbMATH DE Number: 6650785 / rank @@
+Normal rank
@@ Property / zbMATH Keywords @@
+semiconductor manufacturing
@@ Property / zbMATH Keywords: semiconductor manufacturing / rank @@
+Normal rank
@@ Property / zbMATH Keywords @@
+linear programming
@@ Property / zbMATH Keywords: linear programming / rank @@
+Normal rank
@@ Property / zbMATH Keywords @@
+capacity planning
@@ Property / zbMATH Keywords: capacity planning / rank @@
+Normal rank
@@ Property / zbMATH Keywords @@
+inspections
@@ Property / zbMATH Keywords: inspections / rank @@
+Normal rank
@@ Property / zbMATH Keywords @@
+wafers at risk
@@ Property / zbMATH Keywords: wafers at risk / rank @@
+Normal rank

Revision as of 05:24, 28 June 2023