Burn-in considering yield loss and reliability gain for integrated circuits (Q421527)
From MaRDI portal
scientific article
Language | Label | Description | Also known as |
---|---|---|---|
English | Burn-in considering yield loss and reliability gain for integrated circuits |
scientific article |
Statements
Burn-in considering yield loss and reliability gain for integrated circuits (English)
0 references
14 May 2012
0 references