An approximation of semiconductor device by mixed finite element method and characteristics-mixed finite element method

DOI10.1016/j.amc.2013.09.067zbMath1334.78043MaRDI QIDQ275764

Qing Yang, Yi-Rang Yuan

Publication date: 26 April 2016

Published in: Applied Mathematics and Computation (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.amc.2013.09.067

zbMATH Keywords

error estimates; mixed finite element method; characteristics-mixed finite element method; post-processing step; semiconductor device

Mathematics Subject Classification ID

DB lookup for MSC labels failed