Effects of electric and mechanical loads on the morphological evolution of a void in piezoelectric films
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Publication:622943
DOI10.1016/j.apm.2010.07.058zbMath1205.74129OpenAlexW2027709540MaRDI QIDQ622943
Publication date: 13 February 2011
Published in: Applied Mathematical Modelling (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.apm.2010.07.058
Control, switches and devices (``smart materials) in solid mechanics (74M05) Electromagnetic effects in solid mechanics (74F15) Thin films (74K35)
Cites Work
- A two-dimensional probability model for evaluating reliability of piezoelectric micro-actuators
- A refined nonlinear model of composite plates with integrated piezoelectric actuators and sensors
- Diffusive shrinkage of a void within a grain of a stressed polycrystal.
- An axisymmetric model of pore-grain boundary separation
- STRESS ANALYSIS OF HOLES IN ANISOTROPIC ELASTIC SOLIDS: CONFORMAL MAPPING AND BOUNDARY PERTURBATION
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