Planning accelerated life tests for selecting the most reliable product

DOI10.1016/0378-3758(94)90165-1zbMath0798.62099OpenAlexW1993582451WikidataQ127857786 ScholiaQ127857786MaRDI QIDQ1333105

Sheng-Tsaing Tseng

Publication date: 13 September 1994

Published in: Journal of Statistical Planning and Inference (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/0378-3758(94)90165-1

zbMATH Keywords

tablessample sizeWeibull distributionoptimum test plansnumber of failurestype-I censoringaccelerated life testselection rulecensoring timehighly reliable productscost criterionminimum probability of correct selectionasymptotic variance of estimated quantilescensoring plansexpected life-testing timeoptimal ALT sampling plantype- II censoringWeibull-log-linear life-stress model

Mathematics Subject Classification ID

Statistical ranking and selection procedures (62F07) Reliability and life testing (62N05)

Related Items (1)

Applying locally optimal criterion for classifying highly-reliable products with a control

Cites Work

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• Accelerated Testing
• Theory for Optimum Censored Accelerated Life Tests for Normal and Lognormal Life Distributions
• Asymptotically Optimum Over-Stress Tests to Estimate the Survival Probability at a Condition with a Low Expected Failure Probability
• Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value Distributions
• A Bayesian Model for Determining the Optimal Test Stress for a Single Test Unit
• Selecting the most reliable design under type-II censored accelerated testing

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