Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method (Q1958244)

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Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method
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    Dual BIE approaches for modeling electrostatic MEMS problems with thin beams and accelerated by the fast multipole method (English)
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    28 September 2010
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    fast multipole method
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    boundary element method
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    electrostatic problems
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    MEMS
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