Reliability analysis for devices subject to competing failure processes based on chance theory

DOI10.1016/j.apm.2019.05.036zbMath1481.60188OpenAlexW2947513710WikidataQ127820044 ScholiaQ127820044MaRDI QIDQ1985115

Yanqing Wen, Baoliang Liu, Zhi-Qiang Zhang

Publication date: 7 April 2020

Published in: Applied Mathematical Modelling (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1016/j.apm.2019.05.036

zbMATH Keywords

shock modelsuncertainty theoryuncertain variableuncertain distributioncompeting failure processes

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25) Fuzzy and other nonstochastic uncertainty mathematical programming (90C70) Applications of renewal theory (reliability, demand theory, etc.) (60K10) Point processes (e.g., Poisson, Cox, Hawkes processes) (60G55)

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