An improved model-based method to test circuit faults
From MaRDI portal
Publication:2566007
DOI10.1016/j.tcs.2005.04.004zbMath1077.94034OpenAlexW2002736809MaRDI QIDQ2566007
Xiaochun Cheng, Chengqi Zhang, Dantong Ouyang, Jiang Yunfei
Publication date: 22 September 2005
Published in: Theoretical Computer Science (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1016/j.tcs.2005.04.004
Cites Work
This page was built for publication: An improved model-based method to test circuit faults