Deterministic identity testing of depth-4 multilinear circuits with bounded top fan-in
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Publication:2875192
DOI10.1145/1806689.1806779zbMath1293.90040MaRDI QIDQ2875192
Partha Mukhopadhyay, Zohar S. Karnin, Amir Shpilka, Ilya Volkovich
Publication date: 13 August 2014
Published in: Proceedings of the forty-second ACM symposium on Theory of computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1145/1806689.1806779
derandomization; arithmetic circuits; bounded depth circuits; identity testing; multilinear circuits
90C05: Linear programming
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