Optimum simple step-stress accelerated life tests with censoring

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Publication:3471575


DOI10.1109/24.46476zbMath0695.62226WikidataQ56966554 ScholiaQ56966554MaRDI QIDQ3471575

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Publication date: 1989

Published in: IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1109/24.46476


62N05: Reliability and life testing


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