A proportional hazards approach to correlate SiO/sub 2/-breakdown voltage and time distributions
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Publication:3492946
DOI10.1109/24.55873zbMath0709.62670OpenAlexW1972444012MaRDI QIDQ3492946
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Publication date: 1990
Published in: IEEE Transactions on Reliability (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1109/24.55873
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