Goodness-of-Fit Tests for GEE Modeling with Binary Responses
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Publication:4666009
DOI10.2307/3109778zbMath1058.62524WikidataQ52241424 ScholiaQ52241424MaRDI QIDQ4666009
Huiman X. Barnhart, John M. Williamson
Publication date: 11 April 2005
Published in: Biometrics (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.2307/3109778
62G10: Nonparametric hypothesis testing
62G20: Asymptotic properties of nonparametric inference
62G35: Nonparametric robustness
62P10: Applications of statistics to biology and medical sciences; meta analysis
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