Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter
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Publication:4907583
DOI10.1137/10848232zbMath1272.68162arXiv1011.3234OpenAlexW2015393485MaRDI QIDQ4907583
Publication date: 4 February 2013
Published in: SIAM Journal on Computing (Search for Journal in Brave)
Full work available at URL: https://arxiv.org/abs/1011.3234
Analysis of algorithms and problem complexity (68Q25) Symbolic computation and algebraic computation (68W30)
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