Linear Regression Analysis for Highly Stratified Failure Time Data
From MaRDI portal
Publication:5288912
DOI10.2307/2290336zbMath0775.62171MaRDI QIDQ5288912
Eric W. M. Lee, Zhiliang Ying, L. J. Wei
Publication date: 7 September 1993
Full work available at URL: https://doi.org/10.2307/2290336
Related Items
The estimation of treatment effect for the censored bivariate data under the univariate censoring, Hierarchical Proportional Hazards Regression Models for Highly Stratified Data, A Linear Mixed‐Effects Model for Multivariate Censored Data, Nonparametric models for clustered data: Application to root survival study, Nonparametric models for clustered data: Application to root survival study, Nonparametric models for clustered data: Application to root survival study, Marginal accelerated hazard model with multivariate failure time data, Generalized estimating equations for analyzing multivariate survival data, Marginal Analysis of Correlated Failure Time Data with Informative Cluster Sizes, Checking the linear transformation model for clustered failure time observations, Marginal semiparametric multivariate accelerated failure time model with generalized estimating equations, Local linear regression on correlated survival data, Rank regression for accelerated failure time model with clustered and censored data, An efficient Gehan-type estimation for the accelerated failure time model with clustered and censored data, Bayesian analysis of paired survival data using a bivariate exponential distribution, Modeling the agreement of discrete bivariate survival times using kappa coefficient, Linear signed-rank tests for paired survival data subject to a common censoring time, An EM-like algorithm for the semiparametric accelerated failure time gamma frailty model, Nonparametric confidence intervals for the ratio of marginal hazard rates of paired survival times, Analysis of Failure Time Data with Mixed-Effects Accelerated Failure Time Model, Nonparametric Models and Methods for Designs with Dependent Censored Data: Part I
