Deterministic Identity Testing of Depth-4 Multilinear Circuits with Bounded Top Fan-in
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Publication:5408760
DOI10.1137/110824516zbMath1285.68067MaRDI QIDQ5408760
Ilya Volkovich, Amir Shpilka, Partha Mukhopadhyay, Zohar S. Karnin
Publication date: 11 April 2014
Published in: SIAM Journal on Computing (Search for Journal in Brave)
Full work available at URL: https://doi.org/10.1137/110824516
derandomization; arithmetic circuits; bounded depth circuits; identity testing; multilinear circuits
68Q25: Analysis of algorithms and problem complexity
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Unnamed Item, Depth-4 Identity Testing and Noether’s Normalization Lemma, Subexponential size hitting sets for bounded depth multilinear formulas, Read-once polynomial identity testing, Deterministic polynomial identity tests for multilinear bounded-read formulae