A generalized formulation of the linear sampling method with exact characterization of targets in terms of farfield measurements

DOI10.1088/0266-5611/30/3/035011zbMath1291.35377OpenAlexW2075646985MaRDI QIDQ5411977

Lorenzo Audibert, Houssem Haddar

Publication date: 25 April 2014

Published in: Inverse Problems (Search for Journal in Brave)

Full work available at URL: https://hal.inria.fr/hal-00911692/file/ArticlevIP_LA.pdf

zbMATH Keywords

factorization methodlinear sampling methodinverse scattering problems

Mathematics Subject Classification ID

Sampling theory, sample surveys (62D05) Numerical solutions to overdetermined systems, pseudoinverses (65F20) Ill-posedness and regularization problems in numerical linear algebra (65F22) PDEs in connection with optics and electromagnetic theory (35Q60) Factorization theory (including Wiener-Hopf and spectral factorizations) of linear operators (47A68) Laplace operator, Helmholtz equation (reduced wave equation), Poisson equation (35J05) Inverse problems (including inverse scattering) in optics and electromagnetic theory (78A46)

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Uses Software

• Complex Optimization Toolbox

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