Finding ambiguity groups in low testability analog circuits (Q2724344)

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Finding ambiguity groups in low testability analog circuits
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    title
    Finding ambiguity groups in low testability analog circuits (English)
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    DOI
    10.1109/81.873868
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    author
    Jing Pang
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    Stefano Manetti
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    Giulio Fedi
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    Janusz A. Starzyk
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    publication date
    15 December 2002
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    zbMATH DE Number
    1616160
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    zbMATH Keywords
    analog system testing
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    ambiguity groups
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    analog fault diagnosis
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    QR factorization
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