Wavelet-based SPC procedure for complicated functional data

DOI10.1080/00207540500222647zbMath1095.62136OpenAlexW2125462913MaRDI QIDQ5478830

Myong K. Jeong, Ni Wang, Jye-Chyi Lu

Publication date: 13 July 2006

Published in: International Journal of Production Research (Search for Journal in Brave)

Full work available at URL: https://doi.org/10.1080/00207540500222647

zbMATH Keywords

Process controlData reductionQuality improvementControl chartThresholding test

Mathematics Subject Classification ID

Related Items (9)

Online anomaly detection of profiles with varying coefficients via functional mixed effects modelling ⋮ Statistical process control for monitoring non-linear profiles using wavelet filtering and B-Spline approximation ⋮ A wavelet approach for profile monitoring of Poisson distribution with application ⋮ Profile control charts based on nonparametric \(L-1\) regression methods ⋮ Robust estimation of complicated profiles using wavelets ⋮ Otimização de experimentos com variáveis de resposta descritas por perfis ⋮ Data-reduction method for spatial data using a structured wavelet model ⋮ Phase II statistical process control for functional data ⋮ Phase II Monitoring of Nonlinear Profiles

Cites Work

• Adapting to Unknown Smoothness via Wavelet Shrinkage
• Test of Significance Based on Wavelet Thresholding and Neyman's Truncation
• Approximation Theorems of Mathematical Statistics
• A theory for multiresolution signal decomposition: the wavelet representation
• Ten Lectures on Wavelets
• Ideal spatial adaptation by wavelet shrinkage
• A Functional Data—Analytic Approach to Signal Discrimination
• Thresholded scalogram and its applications in process fault detection

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