Accelerated life test plans under intermittent inspection and type-I censoring: The case of weibull failure distribution
From MaRDI portal
Publication:5751820
DOI<1::AID-NAV3220380103>3.0.CO;2-3 10.1002/1520-6750(199102)38:1<1::AID-NAV3220380103>3.0.CO;2-3zbMath0719.62516OpenAlexW1969727327MaRDI QIDQ5751820
Publication date: 1991
Full work available at URL: https://doi.org/10.1002/1520-6750(199102)38:1<1::aid-nav3220380103>3.0.co;2-3
Related Items
Optimal design of accelerated life tests under modified stress loading methods, Optimal design of inspection times for interval censoring, The step-stress tampered failure rate model under interval monitoring, Planning Accelerated Life Tests Under Progressive Type I Interval Censoring with Random Removals, Bayesian analysis for step‐stress accelerated life testing under progressive interval censoring, Optimal accelerated life tests under interval censoring with random removals: the case of Weibull failure distribution
Cites Work