An improved model-based method to test circuit faults (Q2566007)
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scientific article
| Language | Label | Description | Also known as |
|---|---|---|---|
| English | An improved model-based method to test circuit faults |
scientific article |
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An improved model-based method to test circuit faults (English)
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22 September 2005
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Testing
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Search
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Deduction
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Abduction
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Prime implication
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