Identification analysis of defect topologies by self-attention based machine learning (Effect of the number of training data on identification accuracy)

DOI10.14495/jsiaml.16.17MaRDI QIDQ6125985

Takahiko Kurahashi, Ikuo Ihara, Fujio Ikeda, Unnamed Author, Unnamed Author

Publication date: 9 April 2024

Published in: JSIAM Letters (Search for Journal in Brave)

zbMATH Keywords

machine learningdata augmentationdefect detectionself-attentionhammering test

Mathematics Subject Classification ID

Biology and other natural sciences (92-XX) Computer science (68-XX)

This page was built for publication: Identification analysis of defect topologies by self-attention based machine learning (Effect of the number of training data on identification accuracy)