Direct sampling method for anomaly imaging from scattering parameter (Q1749466)

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Direct sampling method for anomaly imaging from scattering parameter
scientific article

    Statements

    title
    Direct sampling method for anomaly imaging from scattering parameter (English)
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    author
    Won-Kwang Park
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    publication date
    16 May 2018
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    zbMATH Keywords
    direct sampling method
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    scattering parameter
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    Bessel functions
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    simulation results
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    Identifiers

    Mathematics Subject Classification ID
    94A08
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    94A20
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    78A45
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    zbMATH DE Number
    6869199
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    OpenAlex ID
    W2782691718
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    arXiv ID
    1801.02511
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