Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (Q441038)
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| Language | Label | Description | Also known as |
|---|---|---|---|
| English | Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples |
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Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (English)
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20 August 2012
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