Pages that link to "Item:Q1754250"
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The following pages link to A note on decision making method for product acceptance based on process capability indices \(C_{\mathrm {pk}}\) and \(C_{\mathrm{pmk}}\) (Q1754250):
Displayed 8 items.
- Optimal design of overall yield-based variable repetitive sampling plans for processes with multiple characteristics (Q821651) (← links)
- Optimal scheme for process quality and cost control by integrating a continuous sampling plan and the process yield index (Q1727003) (← links)
- Efficient truncated repetitive lot inspection using Poisson defect counts and prior information (Q2023984) (← links)
- Variables skip-lot sampling plans on the basis of process capability index for products with a low fraction of defectives (Q2032232) (← links)
- Fuzzy testing model for the lifetime performance of products under consideration with exponential distribution (Q2150789) (← links)
- A sequential test and a sequential sampling plan based on the process capability index \(C_{pmk}\) (Q2155031) (← links)
- Classical and Bayesian estimation of the index<i>C</i><sub><i>pmk</i></sub>and its confidence intervals for normally distributed quality characteristic (Q3389606) (← links)
- Integrated QSS-RS plans based on the process yield index for lot acceptance determination (Q6067511) (← links)
