Pages that link to "Item:Q2294757"

The following pages link to Reliability modeling for mutually dependent competing failure processes due to degradation and random shocks (Q2294757):

Displaying 7 items.

• Reliability analysis for devices subject to competing failure processes based on chance theory (Q1985115) (← links)
• Reliability analysis for multi-component systems with interdependent competing failure processes (Q2243390) (← links)
• Reliability and maintenance of systems subject to gamma degradation and shocks in dynamic environments (Q2243458) (← links)
• Reliability and maintenance modeling for competing risk processes with Weibull inter-arrival shocks (Q2310650) (← links)
• A multiple warm standby repairable system under N-policy with multiple vacations following Markovian arrival process (Q5077447) (← links)
• Reliability analysis for degradation and shock process based on truncated normal distribution (Q5867461) (← links)
• Reliability optimization of parallel-series and series-parallel systems with statistically dependent components (Q6135659) (← links)