Pages that link to "Item:Q2361216"
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The following pages link to Optimal reduction of a spatial monitoring grid: proposals and applications in process control (Q2361216):
Displaying 3 items.
- Statistics for microelectronics (Q6570834) (← links)
- Kriging prediction from a circular grid: application to wafer diffusion (Q6570837) (← links)
- Non-parametric local capability indices for industrial planar manufacts: an application to the etching phase in the microelectronic industry (Q6580749) (← links)
