Pages that link to "Item:Q2519085"
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The following pages link to Optimal burn-in for maximizing reliability of repairable non-series systems (Q2519085):
Displaying 6 items.
- On testing whether burn-in is required under the long-run average cost (Q273740) (← links)
- Effects of manufacturing defects on the device failure rate (Q395910) (← links)
- Burn-in considering yield loss and reliability gain for integrated circuits (Q421527) (← links)
- Burn-in by environmental shocks for two ordered subpopulations (Q976407) (← links)
- Bi-objective burn-in modeling and optimization (Q2449397) (← links)
- Burn-in Procedure Based on a Dependent Covariate Process (Q5262451) (← links)
