Pages that link to "Item:Q4303734"
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The following pages link to Exact maximum likelihood estimation using masked system data (Q4303734):
Displayed 22 items.
- Robust estimation with variational Bayes in presence of competing risks (Q824972) (← links)
- Bayes estimators for reliability measures in geometric distribution model using masked system life test data (Q1023510) (← links)
- Bayesian analysis for masked system failure data using non-identical Weibull models (Q1300937) (← links)
- Estimation of components reliability in a parallel system using masked system life data (Q1406115) (← links)
- Parameter estimations in linear failure rate model using masked data. (Q1428416) (← links)
- Parameter estimations in a general hazard rate model using masked data (Q1826995) (← links)
- Estimation of system components reliabilities using masked data (Q1856016) (← links)
- Bayesian reliability modeling for masked system lifetime data (Q1976503) (← links)
- NHPP-based software reliability growth modeling and optimal release policy for N-version programming system with increasing fault detection rate under imperfect debugging (Q2212674) (← links)
- Semiparametric inference of competing risks data with additive hazards and missing cause of failure under MCAR or MAR assumptions (Q2441046) (← links)
- Estimation of component mean lifetimes of a masked system using unclassified system life data (Q2571932) (← links)
- Maximum likelihood analysis of masked series system lifetime data (Q2581649) (← links)
- Bayes Empirical Bayes Classification of Components Using Masked Data (Q2786221) (← links)
- Bayesian Analysis of Masked Data in Step-stress Accelerated Life Testing (Q2876122) (← links)
- Bayesian Analysis of Competing Risks with Partially Masked Cause of Failure (Q3435741) (← links)
- Inference About the Masking Probabilities in the Competing Risks Model (Q3644999) (← links)
- BAYES EMPIRICAL BAYES APPROACH TO ESTIMATION OF THE FAILURE RATE IN EXPONENTIAL DISTRIBUTION (Q4792103) (← links)
- ANALYSIS OF MASKED DATA IN A DEPENDENT COMPETING RISKS MODEL UNDER UNKNOWN ENVIRONMENT (Q4792113) (← links)
- A software cost model with imperfect debugging, random life cycle and penalty cost (Q4883804) (← links)
- Robust Bayesian estimation of cumulative incidence function for competing risk data with missing causes (Q5086072) (← links)
- STATISTICAL ANALYSIS OF SERIES SYSTEM FOR MASKED DATA UNDER SUCCESSIVE CENSORED LIFE TEST (Q5121360) (← links)
- Analysis of masked data with Lindley failure model (Q6171848) (← links)