Pages that link to "Item:Q4842360"

The following pages link to A discrete‐time model of failure and repair (Q4842360):

Displaying 5 items.

• Optimal lot size and offline inspection policy (Q979807) (← links)
• Determining the optimal probing lot size for the wafer probe operation in semiconductor manufacturing (Q1011272) (← links)
• Optimal lot sizing for products sold under free-repair warranty. (Q1811150) (← links)
• Fuzzy availability assessment for a discrete time repairable multi-state series-parallel system (Q2987962) (← links)
• Three repair strategies (Q4781102) (← links)