Pages that link to "Item:Q5138096"

The following pages link to Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096):

Displaying 2 items.

• Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784) (← links)
• Inference for log‐location‐scale family of distributions under competing risks with progressive type‐I interval censored data (Q6068060) (← links)