Pages that link to "Item:Q5444450"
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The following pages link to Estimating process yield based on <i>S<sub>pk</sub></i> for multiple samples (Q5444450):
Displaying 4 items.
- Production yield measure for multiple characteristics processes based on \(S^T_{pk}\) under multiple samples (Q441038) (← links)
- Sample size determination for production yield estimation with multiple independent process characteristics (Q1041943) (← links)
- Measuring the manufacturing process yield based on fuzzy data (Q3163693) (← links)
- Procedure of the convolution method for estimating production yield with sample size information (Q3163707) (← links)