Pages that link to "Item:Q5856186"
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The following pages link to Reconstruction of contact regions in semiconductor transistors using Dirichlet-Neumann cost functional approach (Q5856186):
Displaying 5 items.
- Topological asymptotic expansion for a thermal problem (Q2045144) (← links)
- A noniterative reconstruction method for solving a time-fractional inverse source problem from partial boundary measurements (Q5014486) (← links)
- Topological sensitivity method for reconstruction of the spatial component in the source term of a time-fractional diffusion equation (Q6054803) (← links)
- Reconstruction and stability analysis of potential appearing in time‐fractional subdiffusion (Q6118914) (← links)
- A non-iterative reconstruction method for the geometric inverse problem for the wave equation (Q6671870) (← links)
