Pages that link to "Item:Q835581"
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The following pages link to A multi-criteria approach for scheduling semiconductor wafer fabrication facilities (Q835581):
Displaying 3 items.
- Configuration and the advantages of the shifting bottleneck procedure for optimizing the job shop total weighted tardiness scheduling problem (Q309064) (← links)
- A memetic algorithm for minimizing total weighted tardiness on parallel batch machines with incompatible job families and dynamic job arrival (Q991390) (← links)
- Rule-based scheduling in wafer fabrication with due date-based objectives (Q1761232) (← links)
