Pages that link to "Item:Q1205462"
From MaRDI portal
The following pages link to Bayesian design for accelerated life testing (Q1205462):
Displayed 20 items.
- Computational enhancements to Bayesian design of experiments using Gaussian processes (Q516451) (← links)
- Investigating design for survival models (Q601763) (← links)
- Some applications of Stieltjes transforms in the construction of optimal designs for nonlinear regression models (Q672073) (← links)
- Quantile dispersion graphs for evaluating and comparing designs for logistic regression models (Q951906) (← links)
- Robust prediction and extrapolation designs for censored data (Q958806) (← links)
- Planning sequential constant-stress accelerated life tests with stepwise loaded auxiliary acceleration factor (Q963891) (← links)
- A note on optimal Bayesian design for nonlinear problems (Q1314495) (← links)
- Bayesian D-optimal designs for exponential regression models (Q1361631) (← links)
- A general Bayes exponential inference model for accelerated life testing (Q1417794) (← links)
- Simulation-based designs for accelerated life tests (Q1591289) (← links)
- Bayesian planning of optimal step-stress accelerated life test for log-location-scale distributions (Q1709418) (← links)
- A note on Bayesian \(c\)-and \(D\)-optimal designs in nonlinear regression models (Q1816981) (← links)
- Bayesian optimal one point designs for one parameter nonlinear models (Q1918218) (← links)
- Advances in Bayesian decision making in reliability (Q2282489) (← links)
- Bayesian accelerated life test plans for series systems with Weibull component lifetimes (Q2306784) (← links)
- Bayesian \(C\)-optimal life testing plans under progressive type-I interval censoring scheme (Q2310598) (← links)
- Fraction of design space plots for generalized linear models (Q2474424) (← links)
- Accelerated life test planning with independent lognormal competing risks (Q2655071) (← links)
- On minimax designs when there are two candidate models (Q4808197) (← links)
- Bayesian<i>D</i>-optimal Accelerated Life Test plans for series systems with competing exponential causes of failure (Q5138096) (← links)