Pages that link to "Item:Q2774142"
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The following pages link to Identification of doping profiles in semiconductor devices (Q2774142):
Displayed 12 items.
- On steepest-descent-Kaczmarz methods for regularizing systems of nonlinear ill-posed equations (Q942384) (← links)
- Second-order approach to optimal semiconductor design (Q946295) (← links)
- Identification of contact regions in semiconductor transistors by level-set methods (Q1414315) (← links)
- Shape identification for natural convection problems using the adjoint variable method (Q1873383) (← links)
- Modeling and simulation of the lateral photovoltage scanning method (Q2239117) (← links)
- A complete analysis of a classical Poisson-Nernst-Planck model for ionic flow (Q2254014) (← links)
- One-dimensional steady-state Poisson-Nernst-Planck systems for ion channels with multiple ion species (Q2378201) (← links)
- Capacitive model for integrated PN varactors of cells with N<sup>+</sup> buried layer (Q3585591) (← links)
- AN OPTIMAL CONTROL APPROACH TO SEMICONDUCTOR DESIGN (Q4798934) (← links)
- Risk-averse optimal control of semilinear elliptic PDEs (Q5126395) (← links)
- Reversal permanent charge and concentrations in ionic flows via Poisson-Nernst-Planck models (Q5157411) (← links)
- Suppressing instability in a Vlasov-Poisson system by an external electric field through constrained optimization (Q6187634) (← links)