Pages that link to "Item:Q2855388"

The following pages link to Fast electromagnetic imaging of thin inclusions in half-space affected by random scatterers (Q2855388):

Displaying 13 items.

• Defect detection from multi-frequency limited data via topological sensitivity (Q275333) (← links)
• Analysis of MUSIC-type imaging functional for single, thin electromagnetic inhomogeneity in limited-view inverse scattering problem (Q349826) (← links)
• Topological derivative strategy for one-step iteration imaging of arbitrary shaped thin, curve-like electromagnetic inclusions (Q422958) (← links)
• Multi-frequency topological derivative for approximate shape acquisition of curve-like thin electromagnetic inhomogeneities (Q488686) (← links)
• Multi-frequency subspace migration for imaging of perfectly conducting, arc-like cracks in full- and limited-view inverse scattering problems (Q728914) (← links)
• A novel study on subspace migration for imaging of a sound-hard arc (Q1672658) (← links)
• Performance analysis of multi-frequency topological derivative for reconstructing perfectly conducting cracks (Q1685474) (← links)
• Shape identification of open sound-hard arcs without priori information in limited-view inverse scattering problem (Q2107180) (← links)
• Analysis of subspace migrations in limited-view inverse scattering problems (Q2339342) (← links)
• Localization of small perfectly conducting cracks from far-field pattern with unknown frequency (Q2344419) (← links)
• Analysis of multi-frequency subspace migration weighted by natural logarithmic function for fast imaging of two-dimensional thin, arc-like electromagnetic inhomogeneities (Q2400702) (← links)
• Analysis of a multi-frequency electromagnetic imaging functional for thin, crack-like electromagnetic inclusions (Q2448390) (← links)
• Reconstruction of thin electromagnetic inhomogeneity without diagonal elements of a multi-static response matrix (Q4582675) (← links)