A Comparison of Several Component-Testing Plans for a Series System

DOI10.1109/TR.1986.4335498MaRDI QIDQ4721050zbMATH OpenOpenAlexFDO

Authors Jia-Her Yan, Mainak Mazumdar

Publication date 1986

Published in IEEE Transactions on Reliability (Search for Journal in Brave)

Full work available at URL https://doi.org/10.1109/tr.1986.4335498

zbMATH Keywords

component-testing proceduresconstant failure ratesconstrained simplex methodconsumer riskcost minimizationmaximum likelihood estimateproducer risk

Mathematics Subject Classification ID

Reliability, availability, maintenance, inspection in operations research (90B25)

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• Optimum attributes component test plans for k-out-of-n:F Weibull systems using prior information
• Series Systems and Reliability Demonstration Tests
• Reliability Test Plans for Series Systems in the Presence of Covariates
• A minmax search for the critical level of a system: The asymmetric case
• A type-II censored, log test time based, component-testing procedure for a parallel system
• Construction of optimal reliability test plans for binary type multi-state strongly coherent systems
• Design of component reliability test plan for a series system having time dependent testing cost with the presence of covariates
• The design of optimum component test plans for system reliability

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